Alphacore will develop a novel wireless probing system to examine the performance of microelectronics without the need for heavy equipment or wires. It will introduce test input signals to the device and transfer the output signals to a mobile processor, eliminating the loss of any subtle but important characteristics, especially at higher frequencies. The proposed wireless probe avoids problems of impedance matching and signal attenuation from using long wires/cables; the signal will be measured precisely by the receiving probe, eliminating the need for an oscilloscope/frequency analyzer and further simplifying the entire test architecture. The simplified test process is more user-friendly and cost-effective. Alphacore has extensive experience in RF design and radiation-hardened-by-design technology; our wireless probes can fulfill the demanding needs of space electronics testing and withstand harsh conditions of space environmental testing.
