As a Silver Sponsor this year, we look forward to sharing this symposium with you. We are organizing a special session where we present “Testing for Radiation Effects in Microelectronics” on 4/22 at 3:00.
The IEEE VLSI Test Symposium (VTS) explores test and reliability challenges with emerging trends and novel concepts in test, validation, yield, reliability, and security of microelectronic circuits and systems. The symposium will take place on April 22-24 2024, in Tempe, AZ, USA.
The program this year includes keynotes, scientific paper presentations, short industrial application paper presentations, special sessions, and Innovative Practices sessions.
