As a Gold Supporter this year, we look forward to sharing this symposium with you, including lunch on Monday. Visit our booth to receive a gift of our appreciation, and learn details of Alphacore's data converter, imaging, and power technologies where we will discuss emerging trends and novel concepts in radiation effects test, validation, yield, reliability, and security of microelectronic circuits and systems.
The IEEE VLSI Test Symposium (VTS) explores test and reliability challenges with emerging trends and novel concepts in test, validation, yield, reliability, and security of microelectronic circuits and systems. The symposium will take place on April 28-30, in Tempe, AZ, USA.
The program this year includes keynotes, scientific paper presentations, short industrial application paper presentations, special sessions, and Innovative Practices sessions.
